Authors:Martijn Frijlink, David E. Goertz, Luc C.A. Van Damme, Rob Krams, and Antonius F.W. Van Der SteenFrom:
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.
(Vol. 53, Issue 10)
Peer-Reviewed
Oct. 200664 words
Article
Citation Only
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